روبشی پیمایشی میکروسکوپ در علوم و فناوری نانو Scanning Probe Microscopy in Nanoscience and Nanotechnology
- نوع فایل : کتاب
- زبان : انگلیسی
- نویسنده : Hendrik Hölscher
- ناشر : Springer-Verlag Berlin Heidelberg
- چاپ و سال / کشور: 2010
- شابک / ISBN : 3642035345, 9783642035340
Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
